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Die Aussteller zur MSE 2016: NT-MDT

From cutting edge scientific research to routine surface investigations, NT-MDT has a unique and unrivalled portfolio of scanning probe microscopes.

Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics. As an innovator in SPM for over 20 years, NT-MDT has a specialised high-performance solution for your research needs.

NTEGRA Spectra II – automated AFM-Raman, SNOM and TERS system

NTEGRA IR – nanoscale AFM & IR s-SNOM imaging



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Dieser Newsletter wird herausgegeben von der Deutschen Gesellschaft für Materialkunde e.V. (Impressum)
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Redaktion: Dipl.-Ing. Fahima Fischer
Kontakt: presse@dgm.de

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